NEWLIMITS-T4: Characterization, Test Platforms and Materials Benchmarking
The theme vision is to develop complete understanding of 2D materials and hybrids’ properties. Establish materials benchmarks in view of device performance expectations and suitable characterization/testing platforms. The theme goals include:
- Understand center TMD properties by linking in-situ and ex-situ characterization;
- Materials benchmarking;
- Circuits and architecture benchmarking of 2D devices;
- Strong collaborations with NIST to develop measurement and characterization standards for 2D materials and devices.
- Research
- T1: Novel Computing and Storage Paradigms Based on 2D Materials and Device
- T2: 2D Materials, Devices, and Interconnect Technologies
- T3: Advanced Manufacturing & Processing of 2D Materials, Novel Semiconductors & Topological Insulators
- T4: Characterization, Test Platforms and Materials Benchmarking
- T5: Simulations and Modeling