NEW LIMITS NEW materials for LogIc, Memory and InTerconnectS

NEWLIMITS-T4: Characterization, Test Platforms and Materials Benchmarking

The theme vision is to develop complete understanding of 2D materials and hybrids’ properties. Establish materials benchmarks in view of device performance expectations and suitable characterization/testing platforms.  The theme goals include:

  1. Understand center TMD properties by linking in-situ and ex-situ characterization;
  2. Materials benchmarking;
  3. Circuits and architecture benchmarking of 2D devices;
  4. Strong collaborations with NIST to develop measurement and characterization standards for 2D materials and devices.