Introduction to XPS workshop - What you should know about X-ray pohotoelectron spectroscopy
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Description
Course Objectives:
- Learn physics principles of X-ray Photoelectron Spectroscopy (XPS)
-Learn about the analysis of surfaces with XPS and limitations of the technique
- Learn approaches for qualitative and quantitative analysis of XPS data
-Learn the types of problems that can be solved with XPS:examples
- Advanced data analysis: coverage calculation, thin film thickness calculation, etc.
Course Description:
XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. The course will teach how and what information can be provided by XPS.
Contact Details
- Angie Sigo
- asigo@purdue.edu
- 765-496-8327