ULVAC Ellipsometer Demonstration
Birck Nanotechnology Center
November 21, 2019
1:30 PM - 4:00 PM
BRK 1201
Description
New Progress on the Channeled Spectroscopic Ellipsometry and its Applications
Presented by: Gai Chin
- ULVAC’s innovative compact high-speed spectroscopic ellipsometer UNECS series products have the best cost- performance in the world.
- The excellent measurement reliability with an extremely high throughput will ensure our customers the best productivity for their semiconductor, FPD, PV devices manufacturing lines and R&D purposes
Contact Details
- Ron Reger
- rreger@purdue.edu
- N/A
