Course Objectives:

• Learn physics principles of X-ray Photoelectron Spectroscopy (XPS).
• Learn about the analysis of surfaces with XPS and limitations of the technique.
• Learn approaches for qualitative and quantitative analysis of XPS data.
• Learn the types of problems that can be solved with XPS: examples.
• Advanced data analysis: coverage calculation, thin film thickness calculation, etc.

Course Description

XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.).
Nowadays XPS has become a standard technique for the characterization of solid surface. 
The course will teach how and what information can be provided by XPS.

Instructor

Dmitry Zemlyanov, Surface Science Application Scientist, Birck Nanotechnology Center, Purdue University.