Legacy Course Catalog
ECE 407 - Semiconductor Measurements Laboratory
| Effectivity: | 05/13/2002 - 12/15/2007 @ Purdue West Lafayette Traditional |
|---|---|
| Credits: | 1 |
| Instructional Types: | Lab |
| Usually Offered: | fal spr |
| Short Title: | Semicond Measure Lab |
| Description: | Experiments incorporating state-of-the-art equipment and measurement techniques are performed to collect electrical characteristics exhibited by a representative set of semiconductor devices including the pn-junction diode, Schottky diode, photo devices (solar cell, photo detectors, LEDs), BJTs, the MOS-Capacitor, MOSFETs, and special resistor-like structures. The devices are subjected to d.c., a.c., and pulse biastry, magnetic fields, optical excitation, and/or temperature ranging. The measured characteristics are subsequently used to deduce information about the internal nature and/or operation of semiconductor devices. |
| School: | School Of Electrical And Computer Engineering |
| Department: | Electrical & Computer Engineering |
| Credit By Exam: | NO |
| Repeatable Flag: | NO |
| Temporary Flag: | NO |
| Full Time Privilege Flag: | NO |
| Honors Flag: | NO |
| Registration Approval Type: | Department |
| Variable Title Flag: | NO |
Fall 2007 *** indicates the course was still an active course and was transferred to the Banner Catalog effective Spring 2008. This course was not expired Fall 2007.
