Legacy Course Catalog
ECE 658 - Semiconductor Material And Device Characterization
| Effectivity: | 08/25/2003 - Fall 2007 *** @ Purdue IUPUI Traditional |
|---|---|
| Credits: | 3 |
| Instructional Types: | Lec |
| Usually Offered: | fal spr |
| Short Title: | Sc Matl Device Charac |
| Description: | A comprehensive survey of modern characterization techniques routinely used to determine solid-state material and device parameters. Concepts and theory underlying the techniques are examined, and sample experimental results are presented. The coverage includes electrical, optical, chemical, and physical characterization methods. |
| School: | School Of Electrical And Computer Engineering |
| Department: | Iupui Courses |
| Credit By Exam: | NO |
| Repeatable Flag: | NO |
| Temporary Flag: | NO |
| Full Time Privilege Flag: | NO |
| Honors Flag: | NO |
| Variable Title Flag: | NO |
Fall 2007 *** indicates the course was still an active course and was transferred to the Banner Catalog effective Spring 2008. This course was not expired Fall 2007.
