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Event Details

SEMINAR: "Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG," by D

January 28 @ 10:30 AM - 11:30 AM - BRK 2001

Carbon materials attract attention of the researchers from different
field of the science from biology to electrical engineering. The surface
and the near-surface region are of the particular interest due to
practical and fundamental applications. However, surface
characterization of the carbon materials might be challenging.

In this presentation examples of surface characterization studies of
carbon specimens will be presented. (1) In particularly, the systematic
XPS (X-ray photoelectron spectroscopy) characterization of graphene
grown on the SiC surface will be reported. This work demonstrates a use
for XPS to characterized surfaces, providing critical information on
thickness of graphene layers. XPS data will be compared with the Raman
data. (2) Covalent Cross-linking Between polythymidine DNA and
Single-walled Carbon Nanotubes (SWCNT) will be considered. The
interaction of ss-DNA with SWCNT and Highly Ordered Pyrolytic Graphite
(HOPG) will be compared. (3) Modification of HOPG surface with mild AC
plasma (O2, H2, Ar, H2O) will be discussed.

Dmitry Zemlyanov received his Ph.D. in Physics and Mathematics from the
Novosibirsk State University, Russia. He is currently a Surface Science
Application Scientist at Birck Nanotechnology Center and he is in charge
for the Surface Analysis Facility at Birck.

Earlier, he was a postdoctoral researcher at the Fritz-Haber-Institute,
Berlin, at Worchester Polytechnic Institute, MA; an adjunct assistant
professor at the Physics Department, Worchester Polytechnic Institute,
MA, and a research fellow at Material and Surface Science Institute,
University of Limerick, Ireland. His research interests include surface
science, heterogeneous catalysis, surface phenomena.

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