Welcome to PRISM at Discovery Park

Though the technology has much promise, RF MEMS switches are prone to a variety of failure mechanisms. Dielectric charging is caused by trapped charges inside the thin dielectric layer and leads to uncontrollable changes of the actuation voltage versus time, and eventually, complete device failure.

The work to be undertaken by PRISM is divided into three science thrusts and two cross-cutting thrusts.

Verification, validation and uncertainty quantification are central to PRISM’s predictive simulation efforts. We adopt a tier-wise approach, building on the complexity of our experiments and simulations progressively. A particular focus of the Center is the use of methods based on polynomial chaos for uncertainty propagation.