Birck Nanotechnology Center

Signatone H-150 Manual Probe Station

General Information

Equipment Name: Signatone H-150 manual probe station

FIC: Marshall Porterfield

Process/Equipment Owner: Guy Telesnicki

Location: Bio-Cleanroom

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System Information

General Description:

The H-150 is designed specifically for the testing of hybrids, MCM's, wafers, substrates, and photonics devices.

Capabilities:

H-150 Series Probe Stations include a three inch square device / substrate chuck and are primarily designed for probing thick film devices such as ceramic substrates, printed circuit boards and hybrid circuits. The H-150 system can be equipped with a four inch diameter wafer chuck for probing wafers up to four inches in diameter.


The modular design provides a wide number of options to suit a broad range of needs. This model includes an aluminum base casting, a device stage with four inches of X-Y travel, a linear motion platen that can be raised and lowered using either a crank or a lever, and a microscope tower for mounting Stereozoom optics in a fixed position. The platen will accept up to six magnetic based micropositioners and a probe card adapter for use with probe cards. Micropositioner electrical connections are made through six pin jacks that correspond to color coded banana plugs.

Useful System Links

Equipment Use Fees
Reserve System*
Schedule Training  

*Must install Coral and be a trained user to reserve a slot on this system.

 

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