Birck Nanotechnology Center

Introduction to XPS workshop - What you should know about X-ray pohotoelectron spectroscopy

January 15 @ 9:00 AM - - January 16 @ 1:00 PM - BRK 2001

Course Objectives:

- Learn physics principles of X-ray Photoelectron Spectroscopy (XPS)

-Learn about the analysis of surfaces with XPS and limitations of the technique

- Learn approaches for qualitative and quantitative analysis of XPS data

-Learn the types of problems that can be solved with XPS:examples

- Advanced data analysis: coverage calculation, thin film thickness calculation, etc.

Course Description:

XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard technique for the characterization of solid surface. The course will teach how and what information can be provided by XPS.

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