Scanning Probe Microscopy

This broad class of microscopes host a variety of measurements that reveal information such as sample topography using AFM, local conductivity using STM or CT-AFM, magnetic domains using MFM, and electric fields using EFM.

Purdue University, 610 Purdue Mall, West Lafayette, IN 47907, (765) 494-4600

© 2017 Purdue University | An equal access/equal opportunity university | Copyright Complaints | Maintained by Birck Nanotechnology Center

Trouble with this page? Disability-related accessibility issue? Please contact Birck Nanotechnology Center at