Scanning Probe Microscopy

This broad class of microscopes host a variety of measurements that reveal information such as sample topography using AFM, local conductivity using STM or CT-AFM, magnetic domains using MFM, and electric fields using EFM.

Electron Microscopy

Electron Microscopes use energetic electrons to image very small features on samples. Some have the capability to do micro-cutting with a Focused Ion Beam (FIB).

Optical Microscopy

Optical microscopes magnify images using white light. Some have other imaging techniques including Nomarsky and confocal.

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