Characterization

Characterization Equipment is used to analyze materials and devices down to the nano scale. Included in this category are instruments for microscopy, surface analysis, film characterization, characterization of bulk substrates, and nanoparticle characterization. Please use the links to the right or the search panel above to find specific pieces of equipment.

Purdue University, 610 Purdue Mall, West Lafayette, IN 47907, (765) 494-4600

© 2017 Purdue University | An equal access/equal opportunity university | Copyright Complaints | Maintained by Birck Nanotechnology Center

Trouble with this page? Disability-related accessibility issue? Please contact Birck Nanotechnology Center at dpweb@purdue.edu.